Defect Lifecycle Management across Mock, SIT, and UAT. International Journal of Computer Technology and Electronics Communication, [S. l.], v. 3, n. 3, p. 2467–2476, 2020. DOI: 10.15680/IJCTECE.2020.0303005. Disponível em: https://ijctece.com/index.php/IJCTEC/article/view/721. Acesso em: 6 oct. 2026.