Cloud-Scale Data Engineering for Real-Time Semiconductor Testing and AI-Powered Chip Diagnostics. International Journal of Computer Technology and Electronics Communication, [S. l.], v. 9, n. 3, p. 1058–1070, 2026. DOI: 10.15680/IJCTECE.2026.0903009. Disponível em: https://ijctece.com/index.php/IJCTEC/article/view/596. Acesso em: 1 aug. 2026.